Hitachi H7700 Transmission Electron Microscope

DSC0560

Features: - Equipped with a tungsten filament emitter;

- Operates at accelerating voltage at 40 kV - 125 kV;

- Achieves lattice resolution of 0.144nm and particle image resolution of 0.35nm at 125 kV;

- Embedded with bottom-mount CCD;

- Allows ± 30 degrees image rotation and montage imaging.

Staff-in-charge:

- Josie
Back-up Support: - Anny / Samuel
Location: LIBSB 109

 

Hitachi SU8010 Scanning Electron Microscope with iXRF EDS System

 SU8010

Features: The Microscope

- Equipped for cold field emission;

- Operates at accelerating voltage at 0.5 - 30 kV; and beam deceleration at 0.1 – 2.5 kV;

- Image resolution : 1.0nm at 15kV; 1.3nm at 1kV;

- Fitted with 2 secondary electron detectors (upper & lower); can perform SE/BSE signal mixing function;

- Imaging magnifications:
×30 – ×2,000 (Low Mag mode)
×400 – ×800,000 (HC mode)

The EDS system

- Equipped with electronically cooled silicon drift detector;

- Sensor active area: 30 mm2;

- Resolution: 128eV/Be-Pu;

- For qualitative and semi-quantitative micro-analysis of elements on material and biological samples;

- Iridium Ultra Premium software package features spectra, mapping imaging and automation analysis tools.

Staff-in-charge:

- Josie
Back-up Support: - Anny / Samuel
Location: LIBSB 109